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PROFESSOR Fellow of American Physical Society |
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| Studies of semiconductor layered structures, quantum dots, and photovoltaic materials using synchrotron radiation | ||
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Semiconductors of reduced dimensionality (quantum wells, superlattices, arrays of quantum wires and quantum dots) exhibit many intriguing physical properties not found in bulk materials. These systems are of great interest for fundamental studies and for technological applications. X-rays from synchroton radiation can provide unique tools for probing the microscopic structure in these materials. A variety of X-ray techniques is applied to the study of semiconductor systems important for the development of electronic and photonic devices, as well as high-efficiency solar cells. SELECTED PROJECTS
PUBLICATIONS
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Fig. 1 Studies of doped quantum dots using X-ray-excited
luminescence (XEL) technique developed in this laboratory. (b) XEL results around the Y K-edge.
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| Fig. 2 Studies
of heterojunction photovoltaic materials using the angular dependence of
X-ray fluorescence (ADXRF) technique developedin this laboratory. |
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a) Normalized X-ray fluorescence at various
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(b) Angular dependence of Te K X-ray fluorescence
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| Last Updated: January 7, 2002 |
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